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Category
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Working Paper(outside IIR)
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Author
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Kohzu, Hideaki
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Article Title
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Screenig and Testing Techniques for GaAs Power MESFETs
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Institution
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International Symposium for Testing & Failure Analysis (with coauthors)
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Number
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Release Date
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1979
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Abstract
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Notes
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URL
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Label
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技術経営
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Register date
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1979/12/31
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